Design for Test (DFT) Engineer

Your tasks

Provide Design for Test (DFT) implementation, verification and engineering support for semiconductor IP, ASIC and System-on-Chip (SoC) projects, from pre-silicon development through post-silicon test debugging.

• Analyse project requirements and develop DFT implementation and validation methodologies for semiconductor IP and SoC designs.
• Implement and verify scan insertion, scan chain architecture, scan compression and DFT design rule checks.
• Generate and validate Automatic Test Pattern Generation (ATPG) patterns for stuck-at, transition, at-speed and path-delay testing.
• Analyse fault coverage, investigate coverage gaps and optimise test patterns and test execution time.
• Implement and support Memory Built-In Self-Test (MBIST), Memory Built-In Self-Repair (MBISR), hierarchical DFT, IEEE 1500 wrappers and Test Access Mechanisms (TAM).
• Perform DFT simulations, timing-aware verification and test pattern debugging.
• Work with RTL, physical design, verification and client engineering teams to resolve DFT integration and implementation issues.
• Support semiconductor IP integration into customer DFT and production ATPG environments.
• Investigate post-silicon test failures by correlating tester results with pre-silicon simulation data.
• Evaluate trade-offs involving test coverage, execution time, design area, power and timing.
• Develop and maintain scripts to automate DFT flows, validation, log analysis and reporting.
• Prepare DFT specifications, validation reports, coverage analyses and project documentation.
• Recommend improvements to DFT methodologies and engineering workflows.

Requirements

• Bachelor’s or Master’s Degree in Electrical Engineering, Electronics, Microelectronics, Computer Engineering or a related discipline.
• 5–6 years of relevant hands-on experience in DFT implementation and verification for ASIC, semiconductor IP or SoC designs.
• Strong knowledge of scan insertion, scan compression, ATPG, DFT rule checking, fault simulation and coverage analysis.
• Experience with MBIST, MBISR and hierarchical DFT methodologies.
• Familiarity with JTAG (IEEE 1149.1), IJTAG (IEEE 1687), IEEE 1500 wrappers and test access architectures.
• Hands-on experience with relevant EDA tools, such as Siemens Tessent or Cadence Modus, and simulation or debugging tools such as Xcelium, Synopsys VCS or Verdi.
• Proficiency in Tcl scripting, with working knowledge of Python or Bash for automation.
• Working knowledge of Verilog or SystemVerilog.
• Understanding of scan timing constraints, timing-aware simulation and DFT impacts on area, power and performance.
• Ability to debug implementation issues, analyse simulation results and investigate silicon test failures.
• Strong analytical, documentation, communication and teamwork skills.